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Testing Static Random Access Memories: Defects, Fault Models and Test Patterns (Frontiers in Electronic Testing (26))

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Attributes

Authors
Hamdioui, Said
Edition
2004
Formats
Illustrated
Genre
Circuits & components
Label
Springer
Content Languages
[object Object], [object Object], [object Object]
Number Of Items
1
Number Of Pages
241
Publication Date
2004-03-31
Publisher
Springer
Studio
Springer
Lang
en-US

Product Identifiers

AIDAlgopix unique identifier
AIDL8M534001
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